%0 Conference Paper %1 conf/icst/ShinB16 %A Shin, Donghwan %A Bae, Doo-Hwan %B ICST %D 2016 %I IEEE Computer Society %K dblp %P 299-308 %T A Theoretical Framework for Understanding Mutation-Based Testing Methods. %U http://dblp.uni-trier.de/db/conf/icst/icst2016.html#ShinB16 %@ 978-1-5090-1827-7

@inproceedings{conf/icst/ShinB16, added-at = {2023-03-23T00:00:00.000+0100}, author = {Shin, Donghwan and Bae, Doo-Hwan}, biburl = {https://www.bibsonomy.org/bibtex/2b5b916fbc964703697b628165099adf1/dblp}, booktitle = {ICST}, crossref = {conf/icst/2016}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICST.2016.22}, interhash = {26feb17d2193feea6e8acc81450a1158}, intrahash = {b5b916fbc964703697b628165099adf1}, isbn = {978-1-5090-1827-7}, keywords = {dblp}, pages = {299-308}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T18:22:37.000+0200}, title = {A Theoretical Framework for Understanding Mutation-Based Testing Methods.}, url = {http://dblp.uni-trier.de/db/conf/icst/icst2016.html#ShinB16}, year = 2016 }