%0 Conference Paper %1 conf/ats/NakuraIA12 %A Nakura, Toru %A Iizuka, Tetsuya %A Asada, Kunihiro %B Asian Test Symposium %D 2012 %I IEEE Computer Society %K dblp %P 252-257 %T Impact of All-Digital PLL on SoC Testing. %U http://dblp.uni-trier.de/db/conf/ats/ats2012.html#NakuraIA12 %@ 978-1-4673-4555-2

@inproceedings{conf/ats/NakuraIA12, added-at = {2023-03-24T00:00:00.000+0100}, author = {Nakura, Toru and Iizuka, Tetsuya and Asada, Kunihiro}, biburl = {https://www.bibsonomy.org/bibtex/2c991b40bf67212fa4db57f87d32cfb69/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2012}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2012.22}, interhash = {34dd9e97bf57609a772d5d870a942c51}, intrahash = {c991b40bf67212fa4db57f87d32cfb69}, isbn = {978-1-4673-4555-2}, keywords = {dblp}, pages = {252-257}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:33.000+0200}, title = {Impact of All-Digital PLL on SoC Testing.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2012.html#NakuraIA12}, year = 2012 }