@article{journals/mr/AresuCDCAMSDKD02,
title = {High-resolution SILC measurements of thin SiO2 at ultra low voltages.},
author = {S. Aresu and W. De Ceuninck and R. Dreesen and K. Croes and E. Andries and J. Manca and L. De Schepper and Robin Degraeve and Ben Kaczer and M. D'Olieslaeger},
journal = {Microelectronics Reliability},
number = {9-11},
pages = {1485-1489},
url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#AresuCDCAMSDKD02},
volume = {42},
year = {2002},
description = {dblp},
ee = {http://dx.doi.org/10.1016/S0026-2714(02)00175-0}, date = {2007-03-27},
keywords = {dblp }
}
::