%0 Conference Paper %1 conf/itc/HuangLC98 %A Huang, Kuo-Chan %A Lee, Chung-Len %A Chen, Jwu E. %B ITC %D 1998 %I IEEE Computer Society %K dblp %P 567-576 %T Maximization of power dissipation under random excitation for burn-in testing. %U http://dblp.uni-trier.de/db/conf/itc/itc1998.html#HuangLC98 %@ 0-7803-5093-6

@inproceedings{conf/itc/HuangLC98, added-at = {2023-03-23T00:00:00.000+0100}, author = {Huang, Kuo-Chan and Lee, Chung-Len and Chen, Jwu E.}, biburl = {https://www.bibsonomy.org/bibtex/2d2a1ef4c7020da92c3e537326821fee9/dblp}, booktitle = {ITC}, crossref = {conf/itc/1998}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1998.743200}, interhash = {567fc50ad241dfff48641e83d94c24a7}, intrahash = {d2a1ef4c7020da92c3e537326821fee9}, isbn = {0-7803-5093-6}, keywords = {dblp}, pages = {567-576}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:53:01.000+0200}, title = {Maximization of power dissipation under random excitation for burn-in testing.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1998.html#HuangLC98}, year = 1998 }