%0 Journal Article %1 journals/tcad/WagnerBA08 %A Wagner, Ilya %A Bertacco, Valeria %A Austin, Todd M. %D 2008 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 2 %P 380-393 %T Using Field-Repairable Control Logic to Correct Design Errors in Microprocessors. %U http://dblp.uni-trier.de/db/journals/tcad/tcad27.html#WagnerBA08 %V 27

@article{journals/tcad/WagnerBA08, added-at = {2017-05-20T00:00:00.000+0200}, author = {Wagner, Ilya and Bertacco, Valeria and Austin, Todd M.}, biburl = {https://www.bibsonomy.org/bibtex/2d3be6621bf1fcb7e7641ef680128d464/dblp}, ee = {https://doi.org/10.1109/TCAD.2007.907239}, interhash = {5e38c00be0c68b1c6acae47ecc5ab51b}, intrahash = {d3be6621bf1fcb7e7641ef680128d464}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 2, pages = {380-393}, timestamp = {2017-05-24T00:18:22.000+0200}, title = {Using Field-Repairable Control Logic to Correct Design Errors in Microprocessors.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad27.html#WagnerBA08}, volume = 27, year = 2008 }