%0 Conference Paper %1 conf/asscc/MahfuzulSIO14 %A Mahfuzul, Islam A. K. M. %A Shiomi, Jun %A Ishihara, Tohru %A Onodera, Hidetoshi %B A-SSCC %D 2014 %I IEEE %K dblp %P 45-48 %T Wide-supply-range all-digital leakage variation sensor for on-chip process and temperature monitoring. %U http://dblp.uni-trier.de/db/conf/asscc/asscc2014.html#MahfuzulSIO14 %@ 978-1-4799-4090-5

@inproceedings{conf/asscc/MahfuzulSIO14, added-at = {2022-12-07T00:00:00.000+0100}, author = {Mahfuzul, Islam A. K. M. and Shiomi, Jun and Ishihara, Tohru and Onodera, Hidetoshi}, biburl = {https://www.bibsonomy.org/bibtex/2dbd7d2be9106f61481f793b81b59c079/dblp}, booktitle = {A-SSCC}, crossref = {conf/asscc/2014}, ee = {https://doi.org/10.1109/ASSCC.2014.7008856}, interhash = {c1e824535fbf156c55ad7e5343f88f3f}, intrahash = {dbd7d2be9106f61481f793b81b59c079}, isbn = {978-1-4799-4090-5}, keywords = {dblp}, pages = {45-48}, publisher = {IEEE}, timestamp = {2024-04-10T21:35:55.000+0200}, title = {Wide-supply-range all-digital leakage variation sensor for on-chip process and temperature monitoring.}, url = {http://dblp.uni-trier.de/db/conf/asscc/asscc2014.html#MahfuzulSIO14}, year = 2014 }