%0 Conference Paper %1 conf/itc/QuerbachKBZAESD14 %A Querbach, Bruce %A Khanna, Rahul %A Blankenbeckler, David %A Zhang, Yulan %A Anderson, Ronald T. %A Ellis, David G. %A Schoenborn, Zale T. %A Deyati, Sabyasachi %A Chiang, Patrick %B ITC %D 2014 %I IEEE Computer Society %K dblp %P 1-10 %T A reusable BIST with software assisted repair technology for improved memory and IO debug, validation and test time. %U http://dblp.uni-trier.de/db/conf/itc/itc2014.html#QuerbachKBZAESD14 %@ 978-1-4799-4722-5

@inproceedings{conf/itc/QuerbachKBZAESD14, added-at = {2023-03-23T00:00:00.000+0100}, author = {Querbach, Bruce and Khanna, Rahul and Blankenbeckler, David and Zhang, Yulan and Anderson, Ronald T. and Ellis, David G. and Schoenborn, Zale T. and Deyati, Sabyasachi and Chiang, Patrick}, biburl = {https://www.bibsonomy.org/bibtex/2dd95a30115964a5c2ae7da1ccd279470/dblp}, booktitle = {ITC}, crossref = {conf/itc/2014}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035340}, interhash = {84970fd6ad2dd1399b5a0cec042e776f}, intrahash = {dd95a30115964a5c2ae7da1ccd279470}, isbn = {978-1-4799-4722-5}, keywords = {dblp}, pages = {1-10}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:29:56.000+0200}, title = {A reusable BIST with software assisted repair technology for improved memory and IO debug, validation and test time.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2014.html#QuerbachKBZAESD14}, year = 2014 }