%0 Conference Paper %1 conf/aied/IshiiU15 %A Ishii, Takatoshi %A Ueno, Maomi %B AIED %D 2015 %E Conati, Cristina %E Heffernan, Neil T. %E Mitrovic, Antonija %E Verdejo, M. Felisa %I Springer %K dblp %P 638-641 %T Clique Algorithm to Minimize Item Exposure for Uniform Test Forms Assembly. %U http://dblp.uni-trier.de/db/conf/aied/aied2015.html#IshiiU15 %V 9112 %@ 978-3-319-19772-2

@inproceedings{conf/aied/IshiiU15, added-at = {2017-05-23T00:00:00.000+0200}, author = {Ishii, Takatoshi and Ueno, Maomi}, biburl = {https://www.bibsonomy.org/bibtex/2e5ed94232852e5a344fd16fbdbd9e08b/dblp}, booktitle = {AIED}, crossref = {conf/aied/2015}, editor = {Conati, Cristina and Heffernan, Neil T. and Mitrovic, Antonija and Verdejo, M. Felisa}, ee = {https://doi.org/10.1007/978-3-319-19773-9_80}, interhash = {6d3ba7139bccb4569b9f56d7cfd2f485}, intrahash = {e5ed94232852e5a344fd16fbdbd9e08b}, isbn = {978-3-319-19772-2}, keywords = {dblp}, pages = {638-641}, publisher = {Springer}, series = {Lecture Notes in Computer Science}, timestamp = {2024-04-09T09:39:34.000+0200}, title = {Clique Algorithm to Minimize Item Exposure for Uniform Test Forms Assembly.}, url = {http://dblp.uni-trier.de/db/conf/aied/aied2015.html#IshiiU15}, volume = 9112, year = 2015 }