%0 Conference Paper %1 conf/itc/MurakamiKSPR00 %A Murakami, Atsushi %A Kajihara, Seiji %A Sasao, Tsutomu %A Pomeranz, Irith %A Reddy, Sudhakar M. %B ITC %D 2000 %I IEEE Computer Society %K dblp %P 376-384 %T Selection of potentially testable path delay faults for test generation. %U http://dblp.uni-trier.de/db/conf/itc/itc2000.html#MurakamiKSPR00 %@ 0-7803-6546-1

@inproceedings{conf/itc/MurakamiKSPR00, added-at = {2023-03-23T00:00:00.000+0100}, author = {Murakami, Atsushi and Kajihara, Seiji and Sasao, Tsutomu and Pomeranz, Irith and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/2ee10d5c8b61d9af7276371dcc96c1ec6/dblp}, booktitle = {ITC}, crossref = {conf/itc/2000}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2000.894227}, interhash = {7058eb12aed2430952693ca125aa77eb}, intrahash = {ee10d5c8b61d9af7276371dcc96c1ec6}, isbn = {0-7803-6546-1}, keywords = {dblp}, pages = {376-384}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:46.000+0200}, title = {Selection of potentially testable path delay faults for test generation.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2000.html#MurakamiKSPR00}, year = 2000 }