%0 Conference Paper %1 shull-etal:2002 %A Shull, F. %A Basili, V. %A Boehm, B. %A Brown, A. W. %A Costa, P. %A Lindvall, M. %A Port, D. %A Rus, I. %A Tesoriero, R. %A Zelkowitz, M. %B VIII International Symposium on Software Metrics (METRICS'02) %C Washigton, DC, USA %D 2002 %I IEEE Computer Society %K defects metrics quality review risk software %P 249-258 %R 10.1109/METRIC.2002.1011343 %T What we have learned about fighting defects

@inproceedings{shull-etal:2002, added-at = {2012-02-03T17:05:10.000+0100}, address = {Washigton, DC, USA}, author = {Shull, F. and Basili, V. and Boehm, B. and Brown, A. W. and Costa, P. and Lindvall, M. and Port, D. and Rus, I. and Tesoriero, R. and Zelkowitz, M.}, biburl = {https://www.bibsonomy.org/bibtex/2ee33f6089498e732d4b8c1b7691c17e2/dimapin}, booktitle = {VIII International Symposium on Software Metrics (METRICS'02)}, doi = {10.1109/METRIC.2002.1011343}, interhash = {db17691bc345bfae8a1a573b08859ee0}, intrahash = {ee33f6089498e732d4b8c1b7691c17e2}, keywords = {defects metrics quality review risk software}, month = {June}, owner = {magsilva}, pages = {249-258}, publisher = {IEEE Computer Society}, timestamp = {2012-02-03T17:05:10.000+0100}, title = {What we have learned about fighting defects}, year = 2002 }