%0 Conference Paper %1 conf/itc/ZhangLBSCB14 %A Zhang, Shanghang %A Li, Xin %A Blanton, Ronald D. %A da Silva, José Machado %A Jr., John M. Carulli %A Butler, Kenneth M. %B ITC %D 2014 %I IEEE Computer Society %K dblp %P 1-10 %T Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling. %U http://dblp.uni-trier.de/db/conf/itc/itc2014.html#ZhangLBSCB14 %@ 978-1-4799-4722-5

@inproceedings{conf/itc/ZhangLBSCB14, added-at = {2023-03-23T00:00:00.000+0100}, author = {Zhang, Shanghang and Li, Xin and Blanton, Ronald D. and da Silva, José Machado and Jr., John M. Carulli and Butler, Kenneth M.}, biburl = {https://www.bibsonomy.org/bibtex/2f60f79d1b91aaf5a79d7c8475145d1b7/dblp}, booktitle = {ITC}, crossref = {conf/itc/2014}, ee = {https://www.wikidata.org/entity/Q61783097}, interhash = {2f99023a16aafe0164c6134d9690f230}, intrahash = {f60f79d1b91aaf5a79d7c8475145d1b7}, isbn = {978-1-4799-4722-5}, keywords = {dblp}, pages = {1-10}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:29:56.000+0200}, title = {Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2014.html#ZhangLBSCB14}, year = 2014 }