%0 Journal Article %1 journals/jam/HuTG15 %A Hu, Hongzhi %A Tian, Shulin %A Guo, Qing %D 2015 %J J. Appl. Math. %K dblp %P 851837:1-851837:9 %T Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage. %U http://dblp.uni-trier.de/db/journals/jam/jam2015.html#HuTG15 %V 2015

@article{journals/jam/HuTG15, added-at = {2020-07-16T00:00:00.000+0200}, author = {Hu, Hongzhi and Tian, Shulin and Guo, Qing}, biburl = {https://www.bibsonomy.org/bibtex/28991599a19905c03bf4f9f98c44ac0d0/dblp}, ee = {https://www.wikidata.org/entity/Q59112028}, interhash = {2fa4b66de0005aeeaca96b77213c7278}, intrahash = {8991599a19905c03bf4f9f98c44ac0d0}, journal = {J. Appl. Math.}, keywords = {dblp}, pages = {851837:1-851837:9}, timestamp = {2020-07-24T00:20:34.000+0200}, title = {Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage.}, url = {http://dblp.uni-trier.de/db/journals/jam/jam2015.html#HuTG15}, volume = 2015, year = 2015 }