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Power dissipation, variations and nanoscale CMOS design: Test challenges and self-calibration/self-repair solutions.
Swarup Bhunia
, and
Kaushik Roy
.
ITC,
page 1-10.
IEEE,
(
2007
)
@inproceedings{conf/itc/BhuniaR07, added-at = {2012-02-07T00:00:00.000+0100}, author = {Bhunia, Swarup and Roy, Kaushik}, biburl = {http://www.bibsonomy.org/bibtex/2faeaf085ae616fab025a5080d488c8c2/dblp}, booktitle = {ITC}, crossref = {conf/itc/2007}, editor = {Sibert, Jill and Rajski, Janusz}, ee = {http://dx.doi.org/10.1109/TEST.2007.4437659}, interhash = {bf13ae41b10d3b7721e7705ead74dc31}, intrahash = {faeaf085ae616fab025a5080d488c8c2}, isbn = {1-4244-1128-9}, keywords = {dblp}, pages = {1-10}, publisher = {IEEE}, timestamp = {2012-02-07T00:00:00.000+0100}, title = {Power dissipation, variations and nanoscale CMOS design: Test challenges and self-calibration/self-repair solutions.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2007.html#BhuniaR07}, year = 2007 }
%0 Conference Paper %1 conf/itc/BhuniaR07 %A Bhunia, Swarup %A Roy, Kaushik %B ITC %@ 1-4244-1128-9 %D 2007 %E Sibert, Jill %E Rajski, Janusz %I IEEE %K %P 1-10 %T Power dissipation, variations and nanoscale CMOS design: Test challenges and self-calibration/self-repair solutions. %U http://dblp.uni-trier.de/db/conf/itc/itc2007.html#BhuniaR07
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conf/itc/BhuniaR07
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