%0 Journal Article %1 journals/mr/HuangSLL14 %A Huang, X. D. %A Shi, R. P. %A Leung, C. H. %A Lai, Pui-To %D 2014 %J Microelectron. Reliab. %K dblp %N 11 %P 2388-2391 %T Charge-trapping characteristics of BaTiO3 with and without nitridation for nonvolatile memory applications. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#HuangSLL14 %V 54

@article{journals/mr/HuangSLL14, added-at = {2023-10-02T00:00:00.000+0200}, author = {Huang, X. D. and Shi, R. P. and Leung, C. H. and Lai, Pui-To}, biburl = {https://www.bibsonomy.org/bibtex/2ca4f01ae989004be7b127f70604391d2/dblp}, ee = {https://doi.org/10.1016/j.microrel.2014.05.002}, interhash = {30603a4143efcec75be6a477c199ade9}, intrahash = {ca4f01ae989004be7b127f70604391d2}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 11, pages = {2388-2391}, timestamp = {2024-04-09T02:49:59.000+0200}, title = {Charge-trapping characteristics of BaTiO3 with and without nitridation for nonvolatile memory applications.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#HuangSLL14}, volume = 54, year = 2014 }