%0 Journal Article %1 noKey %A Barako, M.T. %A Park, W. %A Marconnet, A.M. %A Asheghi, M. %A Goodson, K.E. %D 2013 %I Springer US %J Journal of Electronic Materials %K InfraredMicroscopy SeebeckCoefficient ThermalConductivity Thermoelectrics ZT myown %N 3 %P 372-381 %R 10.1007/s11664-012-2366-1 %T Thermal Cycling, Mechanical Degradation, and the Effective Figure of Merit of a Thermoelectric Module %U http://dx.doi.org/10.1007/s11664-012-2366-1 %V 42 %X Thermoelectric modules experience performance reduction and mechanical failure due to thermomechanical stresses induced by thermal cycling. The present study subjects a thermoelectric module to thermal cycling and evaluates the evolution of its thermoelectric performance through measurements of the thermoelectric figure of merit,

@article{noKey, abstract = {Thermoelectric modules experience performance reduction and mechanical failure due to thermomechanical stresses induced by thermal cycling. The present study subjects a thermoelectric module to thermal cycling and evaluates the evolution of its thermoelectric performance through measurements of the thermoelectric figure of merit, }, added-at = {2015-05-12T19:40:27.000+0200}, author = {Barako, M.T. and Park, W. and Marconnet, A.M. and Asheghi, M. and Goodson, K.E.}, biburl = {https://www.bibsonomy.org/bibtex/25a545d1ccc8ae2f26ebee9165d6c0d21/tennocrama}, doi = {10.1007/s11664-012-2366-1}, interhash = {3187b467fa3bb59dc122946342c3338a}, intrahash = {5a545d1ccc8ae2f26ebee9165d6c0d21}, issn = {0361-5235}, journal = {Journal of Electronic Materials}, keywords = {InfraredMicroscopy SeebeckCoefficient ThermalConductivity Thermoelectrics ZT myown}, language = {English}, number = 3, pages = {372-381}, publisher = {Springer US}, timestamp = {2015-05-12T19:40:27.000+0200}, title = {Thermal Cycling, Mechanical Degradation, and the Effective Figure of Merit of a Thermoelectric Module}, url = {http://dx.doi.org/10.1007/s11664-012-2366-1}, volume = 42, year = 2013 }