%0 Conference Paper %1 conf/ets/MalandruccoloCFR09 %A Malandruccolo, Vezio %A Ciappa, Mauro %A Fichtner, Wolfgang %A Rothleitner, Hubert %B ETS %D 2009 %I IEEE Computer Society %K dblp %P 67-72 %T Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications. %U http://dblp.uni-trier.de/db/conf/ets/ets2009.html#MalandruccoloCFR09 %@ 978-0-7695-3703-0

@inproceedings{conf/ets/MalandruccoloCFR09, added-at = {2023-03-23T00:00:00.000+0100}, author = {Malandruccolo, Vezio and Ciappa, Mauro and Fichtner, Wolfgang and Rothleitner, Hubert}, biburl = {https://www.bibsonomy.org/bibtex/29716af743c1ddafe5b71d1423b66cbe4/dblp}, booktitle = {ETS}, crossref = {conf/ets/2009}, ee = {https://doi.ieeecomputersociety.org/10.1109/ETS.2009.18}, interhash = {32d8ff101bfed57be910f7a93e10ce93}, intrahash = {9716af743c1ddafe5b71d1423b66cbe4}, isbn = {978-0-7695-3703-0}, keywords = {dblp}, pages = {67-72}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T20:47:13.000+0200}, title = {Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2009.html#MalandruccoloCFR09}, year = 2009 }