Inproceedings,
Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects.
E. Jr., J. Soden, P. Tangyunyong, P. Candelaria, R. Beegle, D. Barton, C. Henderson, and C. Hawkins.ITC, page 23-31. IEEE Computer Society, (1997)
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- conf/itc/ColeSTCBBHH97
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- inproceedings
- booktitle
- ITC
- year
- 1997
- pages
- 23-31
- publisher
- IEEE Computer Society
- crossref
- conf/itc/1997
- ee
- https://doi.ieeecomputersociety.org/10.1109/TEST.1997.639590
- isbn
- 0-7803-4209-7
- url
- http://dblp.uni-trier.de/db/conf/itc/itc1997.html#ColeSTCBBHH97
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%1 conf/itc/ColeSTCBBHH97
%A Jr., Edward I. Cole
%A Soden, Jerry M.
%A Tangyunyong, Paiboon
%A Candelaria, Patrick L.
%A Beegle, Richard W.
%A Barton, Daniel L.
%A Henderson, Christopher L.
%A Hawkins, Charles F.
%B ITC
%D 1997
%I IEEE Computer Society
%K dblp
%P 23-31
%T Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects.
%U http://dblp.uni-trier.de/db/conf/itc/itc1997.html#ColeSTCBBHH97
%@ 0-7803-4209-7
@inproceedings{conf/itc/ColeSTCBBHH97,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Jr., Edward I. Cole and Soden, Jerry M. and Tangyunyong, Paiboon and Candelaria, Patrick L. and Beegle, Richard W. and Barton, Daniel L. and Henderson, Christopher L. and Hawkins, Charles F.},
biburl = {https://www.bibsonomy.org/bibtex/24b488c11377dff799c2053f6c33bb521/dblp},
booktitle = {ITC},
crossref = {conf/itc/1997},
ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1997.639590},
interhash = {4511cc718dcbdadabd53c599bbdfc6e1},
intrahash = {4b488c11377dff799c2053f6c33bb521},
isbn = {0-7803-4209-7},
keywords = {dblp},
pages = {23-31},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T19:53:11.000+0200},
title = {Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc1997.html#ColeSTCBBHH97},
year = 1997
}