%0 Conference Paper %1 conf/itc/BarrettMD99 %A Barrett, Norma %A Martin, Simon %A Dislis, Chryssa %B ITC %D 1999 %I IEEE Computer Society %K dblp %P 124-129 %T Test process optimization: closing the gap in the defect spectrum. %U http://dblp.uni-trier.de/db/conf/itc/itc1999.html#BarrettMD99 %@ 0-7803-5753-1

@inproceedings{conf/itc/BarrettMD99, added-at = {2023-03-23T00:00:00.000+0100}, author = {Barrett, Norma and Martin, Simon and Dislis, Chryssa}, biburl = {https://www.bibsonomy.org/bibtex/2a6236a9a1d149570b007ab92d0fb233a/dblp}, booktitle = {ITC}, crossref = {conf/itc/1999}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1999.805621}, interhash = {468c605230e894306fd0a9e704a1f42b}, intrahash = {a6236a9a1d149570b007ab92d0fb233a}, isbn = {0-7803-5753-1}, keywords = {dblp}, pages = {124-129}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:53:23.000+0200}, title = {Test process optimization: closing the gap in the defect spectrum.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1999.html#BarrettMD99}, year = 1999 }