%0 Conference Paper %1 conf/latw/MorenoCR12 %A Moreno, Jesús %A Champac, Víctor H. %A Renovell, Michel %B LATW %D 2012 %I IEEE Computer Society %K dblp %P 1-6 %T Low voltage testing for interconnect opens under process variations. %U http://dblp.uni-trier.de/db/conf/latw/latw2012.html#MorenoCR12 %@ 978-1-4673-2355-0

@inproceedings{conf/latw/MorenoCR12, added-at = {2023-03-23T00:00:00.000+0100}, author = {Moreno, Jesús and Champac, Víctor H. and Renovell, Michel}, biburl = {https://www.bibsonomy.org/bibtex/26f79dd151258af491d5e7fd0701602cf/dblp}, booktitle = {LATW}, crossref = {conf/latw/2012}, ee = {https://doi.ieeecomputersociety.org/10.1109/LATW.2012.6261231}, interhash = {4737b6239311d925215ab756242b61b0}, intrahash = {6f79dd151258af491d5e7fd0701602cf}, isbn = {978-1-4673-2355-0}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T03:52:14.000+0200}, title = {Low voltage testing for interconnect opens under process variations.}, url = {http://dblp.uni-trier.de/db/conf/latw/latw2012.html#MorenoCR12}, year = 2012 }