%0 Conference Paper %1 conf/essderc/IllarionovWSVOL15 %A Illarionov, Yury %A Waltl, Michael %A Smith, Anderson D. %A Vaziri, Sam %A Östling, Mikael %A Lemme, Max C. %A Grasser, Tibor %B ESSDERC %D 2015 %I IEEE %K dblp %P 172-175 %T Interplay between hot carrier and bias stress components in single-layer double-gated graphene field-effect transistors. %U http://dblp.uni-trier.de/db/conf/essderc/essderc2015.html#IllarionovWSVOL15 %@ 978-1-4673-7135-3

@inproceedings{conf/essderc/IllarionovWSVOL15, added-at = {2022-10-02T00:00:00.000+0200}, author = {Illarionov, Yury and Waltl, Michael and Smith, Anderson D. and Vaziri, Sam and Östling, Mikael and Lemme, Max C. and Grasser, Tibor}, biburl = {https://www.bibsonomy.org/bibtex/27610f1652fc7eb56d6d6d455ab4dcf6f/dblp}, booktitle = {ESSDERC}, crossref = {conf/essderc/2015}, ee = {https://doi.org/10.1109/ESSDERC.2015.7324741}, interhash = {4a377452484b0338f05e420ea79061cc}, intrahash = {7610f1652fc7eb56d6d6d455ab4dcf6f}, isbn = {978-1-4673-7135-3}, keywords = {dblp}, pages = {172-175}, publisher = {IEEE}, timestamp = {2024-04-10T10:01:49.000+0200}, title = {Interplay between hot carrier and bias stress components in single-layer double-gated graphene field-effect transistors.}, url = {http://dblp.uni-trier.de/db/conf/essderc/essderc2015.html#IllarionovWSVOL15}, year = 2015 }