%0 Conference Paper %1 conf/eusipco/CoudrayBKU07 %A Coudray, Nicolas %A Buessler, Jean-Luc %A Kihl, Hubert %A Urban, Jean-Philippe %B EUSIPCO %D 2007 %I IEEE %K dblp %P 120-124 %T Automated image analysis for electron microscopy specimen assessment. %U http://dblp.uni-trier.de/db/conf/eusipco/eusipco2007.html#CoudrayBKU07 %@ 978-839-2134-04-6

@inproceedings{conf/eusipco/CoudrayBKU07, added-at = {2021-08-09T00:00:00.000+0200}, author = {Coudray, Nicolas and Buessler, Jean-Luc and Kihl, Hubert and Urban, Jean-Philippe}, biburl = {https://www.bibsonomy.org/bibtex/2613f5eccb004c3a0b3270ef7a24f5b66/dblp}, booktitle = {EUSIPCO}, crossref = {conf/eusipco/2007}, ee = {https://ieeexplore.ieee.org/document/7098776/}, interhash = {53b16b2ae9a8582010168a6174c29b73}, intrahash = {613f5eccb004c3a0b3270ef7a24f5b66}, isbn = {978-839-2134-04-6}, keywords = {dblp}, pages = {120-124}, publisher = {IEEE}, timestamp = {2024-04-10T17:13:42.000+0200}, title = {Automated image analysis for electron microscopy specimen assessment.}, url = {http://dblp.uni-trier.de/db/conf/eusipco/eusipco2007.html#CoudrayBKU07}, year = 2007 }