%0 Journal Article %1 journals/mr/FichtnerFLRBG15 %A Fichtner, Susanne %A Frankeser, Sophia %A Lutz, Josef %A Rupp, Roland %A Basler, Thomas %A Gerlach, Rolf %D 2015 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1677-1681 %T Ruggedness of 1200 V SiC MPS diodes. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#FichtnerFLRBG15 %V 55

@article{journals/mr/FichtnerFLRBG15, added-at = {2023-09-30T00:00:00.000+0200}, author = {Fichtner, Susanne and Frankeser, Sophia and Lutz, Josef and Rupp, Roland and Basler, Thomas and Gerlach, Rolf}, biburl = {https://www.bibsonomy.org/bibtex/274c3216a883a26bc7f6e4ebb58de0195/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.06.088}, interhash = {5857edca2074cf0ad58870275e4b8458}, intrahash = {74c3216a883a26bc7f6e4ebb58de0195}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1677-1681}, timestamp = {2024-04-09T02:50:36.000+0200}, title = {Ruggedness of 1200 V SiC MPS diodes.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#FichtnerFLRBG15}, volume = 55, year = 2015 }