%0 Conference Paper %1 conf/ats/ChanNCLY13 %A Chan, Koay Soon %A Nordin, Nuzrul Fahmi %A Chan, Kim Chon %A Lok, Terk Zyou %A Yong, Chee Wai %B Asian Test Symposium %D 2013 %I IEEE Computer Society %K dblp %P 213-214 %T Multi-histogram ADC BIST System for ADC Linearity Testing. %U http://dblp.uni-trier.de/db/conf/ats/ats2013.html#ChanNCLY13 %@ 978-0-7695-5080-0

@inproceedings{conf/ats/ChanNCLY13, added-at = {2023-03-24T00:00:00.000+0100}, author = {Chan, Koay Soon and Nordin, Nuzrul Fahmi and Chan, Kim Chon and Lok, Terk Zyou and Yong, Chee Wai}, biburl = {https://www.bibsonomy.org/bibtex/26545bb275796ffe5c8d0a76f2d7cc67c/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2013}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2013.47}, interhash = {75197f86a2a3d95ca667734eaf0e0c94}, intrahash = {6545bb275796ffe5c8d0a76f2d7cc67c}, isbn = {978-0-7695-5080-0}, keywords = {dblp}, pages = {213-214}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:09.000+0200}, title = {Multi-histogram ADC BIST System for ADC Linearity Testing.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2013.html#ChanNCLY13}, year = 2013 }