%0 Conference Paper %1 conf/itc/DworakGLWM99 %A Dworak, Jennifer %A Grimaila, Michael R. %A Lee, Sooryong %A Wang, Li-C. %A Mercer, M. Ray %B ITC %D 1999 %I IEEE Computer Society %K dblp %P 1031-1037 %T Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies. %U http://dblp.uni-trier.de/db/conf/itc/itc1999.html#DworakGLWM99 %@ 0-7803-5753-1

@inproceedings{conf/itc/DworakGLWM99, added-at = {2023-03-23T00:00:00.000+0100}, author = {Dworak, Jennifer and Grimaila, Michael R. and Lee, Sooryong and Wang, Li-C. and Mercer, M. Ray}, biburl = {https://www.bibsonomy.org/bibtex/2f1b960b36a82c2ea6a4717c874eaf573/dblp}, booktitle = {ITC}, crossref = {conf/itc/1999}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1999.805836}, interhash = {7b27edbc9b7c9f011a83753c20d3b0a1}, intrahash = {f1b960b36a82c2ea6a4717c874eaf573}, isbn = {0-7803-5753-1}, keywords = {dblp}, pages = {1031-1037}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:53:23.000+0200}, title = {Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1999.html#DworakGLWM99}, year = 1999 }