%0 Conference Paper %1 conf/dac/Maly86 %A Maly, Wojciech %B DAC %D 1986 %E Thomas, Don %I IEEE Computer Society Press %K dblp %P 560-566 %T Optimal order of the VLSI IC testing sequence. %U http://dblp.uni-trier.de/db/conf/dac/dac1986.html#Maly86

@inproceedings{conf/dac/Maly86, added-at = {2018-11-06T00:00:00.000+0100}, author = {Maly, Wojciech}, biburl = {https://www.bibsonomy.org/bibtex/26ddfc00f106959bee06d39f8d64b2a28/dblp}, booktitle = {DAC}, crossref = {conf/dac/1986}, editor = {Thomas, Don}, ee = {https://doi.org/10.1145/318013.318103}, interhash = {7f9bed953f27890cab7c391d47d3ece1}, intrahash = {6ddfc00f106959bee06d39f8d64b2a28}, keywords = {dblp}, pages = {560-566}, publisher = {IEEE Computer Society Press}, timestamp = {2018-11-07T16:13:50.000+0100}, title = {Optimal order of the VLSI IC testing sequence.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac1986.html#Maly86}, year = 1986 }