%0 Conference Paper %1 conf/ats/YuRP04 %A Yu, Chaowen %A Reddy, Sudhakar M. %A Pomeranz, Irith %B Asian Test Symposium %D 2004 %I IEEE Computer Society %K dblp %P 178-183 %T Weighted Pseudo-Random BIST for N-Detection of Single Stuck-at Faults. %U http://dblp.uni-trier.de/db/conf/ats/ats2004.html#YuRP04 %@ 0-7695-2235-1

@inproceedings{conf/ats/YuRP04, added-at = {2023-03-24T00:00:00.000+0100}, author = {Yu, Chaowen and Reddy, Sudhakar M. and Pomeranz, Irith}, biburl = {https://www.bibsonomy.org/bibtex/2da0d20b42ec575598fae612ffbe424c2/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2004}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2004.89}, interhash = {80e1c9f309732686dfee7c44cbf0209d}, intrahash = {da0d20b42ec575598fae612ffbe424c2}, isbn = {0-7695-2235-1}, keywords = {dblp}, pages = {178-183}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:57.000+0200}, title = {Weighted Pseudo-Random BIST for N-Detection of Single Stuck-at Faults.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2004.html#YuRP04}, year = 2004 }