%0 Journal Article %1 journals/iet-cds/RoyR15 %A Roy, Apratim %A Rashid, Muhammad %D 2015 %J IET Circuits Devices Syst. %K dblp %N 3 %P 141-151 %T Common-rail powered reliability improving technique for single-supply complementary metal oxide semiconductor amplifiers. %U http://dblp.uni-trier.de/db/journals/iet-cds/iet-cds9.html#RoyR15 %V 9

@article{journals/iet-cds/RoyR15, added-at = {2020-09-10T00:00:00.000+0200}, author = {Roy, Apratim and Rashid, Muhammad}, biburl = {https://www.bibsonomy.org/bibtex/275fa3b75ef94df3843c2069e0ed3a702/dblp}, ee = {https://doi.org/10.1049/iet-cds.2013.0401}, interhash = {80f6ac6c7e3e52353c27a28e800a8baa}, intrahash = {75fa3b75ef94df3843c2069e0ed3a702}, journal = {IET Circuits Devices Syst.}, keywords = {dblp}, number = 3, pages = {141-151}, timestamp = {2020-09-11T11:44:28.000+0200}, title = {Common-rail powered reliability improving technique for single-supply complementary metal oxide semiconductor amplifiers.}, url = {http://dblp.uni-trier.de/db/journals/iet-cds/iet-cds9.html#RoyR15}, volume = 9, year = 2015 }