%0 Journal Article %1 journals/mr/DieudonneDJRB01 %A Dieudonné, François %A Daugé, F. %A Jomaah, Jalal %A Raynaud, C. %A Balestra, Francis %D 2001 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1417-1420 %T An overview of hot-carrier induced degradation in 0.25 mum Partially and Fully Depleted SOI N-MOSFET's. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#DieudonneDJRB01 %V 41

@article{journals/mr/DieudonneDJRB01, added-at = {2020-02-22T00:00:00.000+0100}, author = {Dieudonné, François and Daugé, F. and Jomaah, Jalal and Raynaud, C. and Balestra, Francis}, biburl = {https://www.bibsonomy.org/bibtex/28e57b91aa8923ac250f7947dafe339de/dblp}, ee = {https://doi.org/10.1016/S0026-2714(01)00165-2}, interhash = {817c1d5978f3cf618517031249871261}, intrahash = {8e57b91aa8923ac250f7947dafe339de}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1417-1420}, timestamp = {2020-02-25T13:28:39.000+0100}, title = {An overview of hot-carrier induced degradation in 0.25 mum Partially and Fully Depleted SOI N-MOSFET's.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#DieudonneDJRB01}, volume = 41, year = 2001 }