%0 Conference Paper %1 conf/ieem/ChongNG15 %A Chong, Kuan Eng %A Ng, Kam-Choi %A Goh, Gerald Guan Gan %B IEEM %D 2015 %I IEEE %K dblp %P 1427-1431 %T Improving Overall Equipment Effectiveness (OEE) through integration of Maintenance Failure Mode and Effect Analysis (maintenance-FMEA) in a semiconductor manufacturer: A case study. %U http://dblp.uni-trier.de/db/conf/ieem/ieem2015.html#ChongNG15 %@ 978-1-4673-8066-9

@inproceedings{conf/ieem/ChongNG15, added-at = {2021-03-03T00:00:00.000+0100}, author = {Chong, Kuan Eng and Ng, Kam-Choi and Goh, Gerald Guan Gan}, biburl = {https://www.bibsonomy.org/bibtex/240ed63cdaa62699a4105162f076838f0/dblp}, booktitle = {IEEM}, crossref = {conf/ieem/2015}, ee = {https://doi.org/10.1109/IEEM.2015.7385883}, interhash = {878920915919e78e01370c1b35f360e7}, intrahash = {40ed63cdaa62699a4105162f076838f0}, isbn = {978-1-4673-8066-9}, keywords = {dblp}, pages = {1427-1431}, publisher = {IEEE}, timestamp = {2024-04-10T11:14:57.000+0200}, title = {Improving Overall Equipment Effectiveness (OEE) through integration of Maintenance Failure Mode and Effect Analysis (maintenance-FMEA) in a semiconductor manufacturer: A case study.}, url = {http://dblp.uni-trier.de/db/conf/ieem/ieem2015.html#ChongNG15}, year = 2015 }