%0 Journal Article %1 journals/mr/KanertDPS03 %A Kanert, Werner %A Dettmer, H. %A Plikat, Boris %A Seliger, Norbert %D 2003 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1839-1846 %T Reliability aspects of semiconductor devices in high temperature applications. %U http://dblp.uni-trier.de/db/journals/mr/mr43.html#KanertDPS03 %V 43

@article{journals/mr/KanertDPS03, added-at = {2020-02-22T00:00:00.000+0100}, author = {Kanert, Werner and Dettmer, H. and Plikat, Boris and Seliger, Norbert}, biburl = {https://www.bibsonomy.org/bibtex/20ae9e9699c29a7e4256f478f1839d0da/dblp}, ee = {https://doi.org/10.1016/S0026-2714(03)00313-5}, interhash = {8b33eda884544545321be401ef350c34}, intrahash = {0ae9e9699c29a7e4256f478f1839d0da}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1839-1846}, timestamp = {2020-02-25T13:27:10.000+0100}, title = {Reliability aspects of semiconductor devices in high temperature applications.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#KanertDPS03}, volume = 43, year = 2003 }