%0 Conference Paper %1 conf/ats/EnokimotoWYMSKAF09 %A Enokimoto, Kazunari %A Wen, Xiaoqing %A Yamato, Yuta %A Miyase, Kohei %A Sone, H. %A Kajihara, Seiji %A Aso, Masao %A Furukawa, Hiroshi %B Asian Test Symposium %D 2009 %I IEEE Computer Society %K dblp %P 99-104 %T CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing. %U http://dblp.uni-trier.de/db/conf/ats/ats2009.html#EnokimotoWYMSKAF09 %@ 978-0-7695-3864-8

@inproceedings{conf/ats/EnokimotoWYMSKAF09, added-at = {2023-03-24T00:00:00.000+0100}, author = {Enokimoto, Kazunari and Wen, Xiaoqing and Yamato, Yuta and Miyase, Kohei and Sone, H. and Kajihara, Seiji and Aso, Masao and Furukawa, Hiroshi}, biburl = {https://www.bibsonomy.org/bibtex/2fc46a0c3596d99c32ef926f77556050c/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2009}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2009.22}, interhash = {8d166e05aee68842ad516b7340d80cb1}, intrahash = {fc46a0c3596d99c32ef926f77556050c}, isbn = {978-0-7695-3864-8}, keywords = {dblp}, pages = {99-104}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:37:09.000+0200}, title = {CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2009.html#EnokimotoWYMSKAF09}, year = 2009 }