%0 Conference Paper %1 conf/ats/GoelCYPT10 %A Goel, Sandeep Kumar %A Chakrabarty, Krishnendu %A Yilmaz, Mahmut %A Peng, Ke %A Tehranipoor, Mohammad %B Asian Test Symposium %D 2010 %I IEEE Computer Society %K %P 307-312 %T Circuit Topology-Based Test Pattern Generation for Small-Delay Defects. %U http://dblp.uni-trier.de/db/conf/ats/ats2010.html#GoelCYPT10 %@ 978-0-7695-4248-5

@inproceedings{conf/ats/GoelCYPT10, added-at = {2023-12-13T03:51:24.000+0100}, author = {Goel, Sandeep Kumar and Chakrabarty, Krishnendu and Yilmaz, Mahmut and Peng, Ke and Tehranipoor, Mohammad}, biburl = {https://www.bibsonomy.org/bibtex/2a47935d4c6a5e620a0317158f3607a6e/admin}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2010}, ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.2010.59}, interhash = {8f886a5b1f7137942c971c4d3575547d}, intrahash = {a47935d4c6a5e620a0317158f3607a6e}, isbn = {978-0-7695-4248-5}, keywords = {}, pages = {307-312}, publisher = {IEEE Computer Society}, timestamp = {2023-12-13T03:51:24.000+0100}, title = {Circuit Topology-Based Test Pattern Generation for Small-Delay Defects.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2010.html#GoelCYPT10}, year = 2010 }