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%0 Conference Paper
%1 conf/vts/YuanLW91
%A Yuan, Jiann-Shiun
%A Liou, Juin J.
%A Wu, David M.
%B VTS
%D 1991
%I IEEE Computer Society
%K dblp
%P 233-238
%T Testing the impact of process defects on ECL power-delay performance.
%U http://dblp.uni-trier.de/db/conf/vts/vts1991.html#YuanLW91
@inproceedings{conf/vts/YuanLW91,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Yuan, Jiann-Shiun and Liou, Juin J. and Wu, David M.},
biburl = {https://www.bibsonomy.org/bibtex/2d7286035daf577d4096820d683868f06/dblp},
booktitle = {VTS},
crossref = {conf/vts/1991},
ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.1991.208164},
interhash = {922a18808dd5d8585c63370c1bb0ffb0},
intrahash = {d7286035daf577d4096820d683868f06},
keywords = {dblp},
pages = {233-238},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T07:35:10.000+0200},
title = {Testing the impact of process defects on ECL power-delay performance.},
url = {http://dblp.uni-trier.de/db/conf/vts/vts1991.html#YuanLW91},
year = 1991
}