%0 Conference Paper %1 conf/ats/AgrawalD05 %A Agrawal, Vishwani D. %A Doshi, Alok S. %B Asian Test Symposium %D 2005 %I IEEE Computer Society %K dblp %P 294-299 %T Concurrent Test Generation. %U http://dblp.uni-trier.de/db/conf/ats/ats2005.html#AgrawalD05 %@ 0-7695-2481-8

@inproceedings{conf/ats/AgrawalD05, added-at = {2023-03-24T00:00:00.000+0100}, author = {Agrawal, Vishwani D. and Doshi, Alok S.}, biburl = {https://www.bibsonomy.org/bibtex/26de699f3d435db31cd35644d1a90def1/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2005.39}, interhash = {92ee954683db1cfba375d8a99bed15a4}, intrahash = {6de699f3d435db31cd35644d1a90def1}, isbn = {0-7695-2481-8}, keywords = {dblp}, pages = {294-299}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:05.000+0200}, title = {Concurrent Test Generation.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2005.html#AgrawalD05}, year = 2005 }