%0 Conference Paper %1 conf/itc/McCluskeyT00 %A McCluskey, Edward J. %A Tseng, Chao-Wen %B ITC %D 2000 %I IEEE Computer Society %K dblp %P 336-343 %T Stuck-fault tests vs. actual defects. %U http://dblp.uni-trier.de/db/conf/itc/itc2000.html#McCluskeyT00 %@ 0-7803-6546-1

@inproceedings{conf/itc/McCluskeyT00, added-at = {2023-03-23T00:00:00.000+0100}, author = {McCluskey, Edward J. and Tseng, Chao-Wen}, biburl = {https://www.bibsonomy.org/bibtex/22b34daab41c42e7e6dcce54bfc7724cc/dblp}, booktitle = {ITC}, crossref = {conf/itc/2000}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2000.894222}, interhash = {933702707f9a3d4b0ae5cae466992880}, intrahash = {2b34daab41c42e7e6dcce54bfc7724cc}, isbn = {0-7803-6546-1}, keywords = {dblp}, pages = {336-343}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:46.000+0200}, title = {Stuck-fault tests vs. actual defects.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2000.html#McCluskeyT00}, year = 2000 }