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%0 Report
%1 WHIT2008
%A White, Mark
%A Bernstein, Joseph B.
%C Pasadena, CA
%D 2008
%K imported
%T Microelectronics reliability : physics-of-failure based modeling
and lifetime evaluation
%U http://hdl.handle.net/2014/40791
@techreport{WHIT2008,
added-at = {2013-01-07T16:10:56.000+0100},
address = {Pasadena, CA},
author = {White, Mark and Bernstein, Joseph B.},
biburl = {https://www.bibsonomy.org/bibtex/2914dc3b72a567f040eea80c0352cc2ae/olivia.bluder},
file = {:P\:\\KAI_AP2\\People\\Plankensteiner\\DISS\\Literature_lifetimeModels\\WHITE2008.pdf:PDF},
institution = {Jet Propulsion Laboratory, National Aeronautics and Space Administration},
interhash = {99c096de596ed5dc0a8192a56dac2c47},
intrahash = {914dc3b72a567f040eea80c0352cc2ae},
keywords = {imported},
owner = {bluder},
timestamp = {2013-01-07T16:11:02.000+0100},
title = {Microelectronics reliability : physics-of-failure based modeling
and lifetime evaluation},
url = {http://hdl.handle.net/2014/40791},
year = 2008
}
