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%0 Journal Article
%1 journals/tvlsi/ChunKIK06
%A Chun, Sunghoon
%A Kim, YongJoon
%A Im, Jung-Been
%A Kang, Sungho
%D 2006
%J IEEE Trans. Very Large Scale Integr. Syst.
%K dblp
%N 6
%P 649-654
%T MICRO: a new hybrid test data compression/decompression scheme.
%U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi14.html#ChunKIK06
%V 14
@article{journals/tvlsi/ChunKIK06,
added-at = {2024-02-27T00:00:00.000+0100},
author = {Chun, Sunghoon and Kim, YongJoon and Im, Jung-Been and Kang, Sungho},
biburl = {https://www.bibsonomy.org/bibtex/238aedd080b5dfd3fde98c8b233b919f7/dblp},
ee = {https://doi.org/10.1109/TVLSI.2006.878227},
interhash = {9f6b4a71dd5da76d95830a2696042117},
intrahash = {38aedd080b5dfd3fde98c8b233b919f7},
journal = {IEEE Trans. Very Large Scale Integr. Syst.},
keywords = {dblp},
number = 6,
pages = {649-654},
timestamp = {2024-04-08T14:31:39.000+0200},
title = {MICRO: a new hybrid test data compression/decompression scheme.},
url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi14.html#ChunKIK06},
volume = 14,
year = 2006
}