%0 Journal Article %1 journals/ieiceee/MohdZS10 %A Mohd, Shukri Korakkottil Kunhi %A Zulkifli, Tun Zainal Azni %A Sidek, Othman %D 2010 %J IEICE Electron. Express %K dblp %N 4 %P 302-307 %T A general on-wafer noise figure de-embedding technique with gain uncertainty analysis. %U http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee7.html#MohdZS10 %V 7

@article{journals/ieiceee/MohdZS10, added-at = {2021-02-12T00:00:00.000+0100}, author = {Mohd, Shukri Korakkottil Kunhi and Zulkifli, Tun Zainal Azni and Sidek, Othman}, biburl = {https://www.bibsonomy.org/bibtex/29d59627b56d164f0a6c35f674deb44bc/dblp}, ee = {https://doi.org/10.1587/elex.7.302}, interhash = {a2847e8b181a59b52d2bb729b4e4c235}, intrahash = {9d59627b56d164f0a6c35f674deb44bc}, journal = {IEICE Electron. Express}, keywords = {dblp}, number = 4, pages = {302-307}, timestamp = {2024-04-09T06:47:54.000+0200}, title = {A general on-wafer noise figure de-embedding technique with gain uncertainty analysis.}, url = {http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee7.html#MohdZS10}, volume = 7, year = 2010 }