%0 Journal Article %1 journals/tvlsi/SinghK03 %A Singh, Mandeep %A Koren, Israel %D 2003 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 5 %P 839-852 %T Fault-sensitivity analysis and reliability enhancement of analog-to-digital converters. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi11.html#SinghK03 %V 11

@article{journals/tvlsi/SinghK03, added-at = {2020-03-11T00:00:00.000+0100}, author = {Singh, Mandeep and Koren, Israel}, biburl = {https://www.bibsonomy.org/bibtex/25c8a45ffec8b0b91a031ca83be867476/dblp}, ee = {https://doi.org/10.1109/TVLSI.2003.812376}, interhash = {a28a149fa814d7521152145a4d7faf5e}, intrahash = {5c8a45ffec8b0b91a031ca83be867476}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 5, pages = {839-852}, timestamp = {2020-03-12T11:43:56.000+0100}, title = {Fault-sensitivity analysis and reliability enhancement of analog-to-digital converters.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi11.html#SinghK03}, volume = 11, year = 2003 }