%0 Journal Article %1 journals/mr/FabianHH04 %A Fabian, Jan-Henning %A Hartmann, Samuel %A Hamidi, Amina %D 2004 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1425-1430 %T Partial Discharge Failure Analysis of AIN Substrates for IGBT Modules. %U http://dblp.uni-trier.de/db/journals/mr/mr44.html#FabianHH04 %V 44

@article{journals/mr/FabianHH04, added-at = {2020-02-22T00:00:00.000+0100}, author = {Fabian, Jan-Henning and Hartmann, Samuel and Hamidi, Amina}, biburl = {https://www.bibsonomy.org/bibtex/2feb86481ba28b4600c7cca186ff37ab7/dblp}, ee = {https://doi.org/10.1016/j.microrel.2004.07.111}, interhash = {a92045b6ffa8c44ce7e35ae1db67fe40}, intrahash = {feb86481ba28b4600c7cca186ff37ab7}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1425-1430}, timestamp = {2020-02-25T13:28:25.000+0100}, title = {Partial Discharge Failure Analysis of AIN Substrates for IGBT Modules.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr44.html#FabianHH04}, volume = 44, year = 2004 }