%0 Conference Paper %1 conf/iwann/AunetB07 %A Aunet, Snorre %A Berge, Hans Kristian Otnes %B IWANN %D 2007 %E Hernández, Francisco Sandoval %E Prieto, Alberto %E Cabestany, Joan %E Graña, Manuel %I Springer %K dblp %P 455-462 %T Statistical Simulations for Exploring Defect Tolerance and Power Consumption for 4 Subthreshold 1-Bit Addition Circuits. %U http://dblp.uni-trier.de/db/conf/iwann/iwann2007.html#AunetB07 %V 4507 %@ 978-3-540-73006-4

@inproceedings{conf/iwann/AunetB07, added-at = {2017-05-23T00:00:00.000+0200}, author = {Aunet, Snorre and Berge, Hans Kristian Otnes}, biburl = {https://www.bibsonomy.org/bibtex/28c5b955c10b5a7d2a8f672bc9bdc4881/dblp}, booktitle = {IWANN}, crossref = {conf/iwann/2007}, editor = {Hernández, Francisco Sandoval and Prieto, Alberto and Cabestany, Joan and Graña, Manuel}, ee = {https://doi.org/10.1007/978-3-540-73007-1_56}, interhash = {a95eb5f753a16bfd15d84e842fcbcd40}, intrahash = {8c5b955c10b5a7d2a8f672bc9bdc4881}, isbn = {978-3-540-73006-4}, keywords = {dblp}, pages = {455-462}, publisher = {Springer}, series = {Lecture Notes in Computer Science}, timestamp = {2017-05-24T16:18:09.000+0200}, title = {Statistical Simulations for Exploring Defect Tolerance and Power Consumption for 4 Subthreshold 1-Bit Addition Circuits.}, url = {http://dblp.uni-trier.de/db/conf/iwann/iwann2007.html#AunetB07}, volume = 4507, year = 2007 }