%0 Conference Paper %1 conf/ats/HigamiSTKT08 %A Higami, Yoshinobu %A Saluja, Kewal K. %A Takahashi, Hiroshi %A ya Kobayashi, Shin %A Takamatsu, Yuzo %B ATS %D 2008 %I IEEE Computer Society %K dblp %P 97-102 %T Increasing Defect Coverage by Generating Test Vectors for Stuck-Open Faults. %U http://dblp.uni-trier.de/db/conf/ats/ats2008.html#HigamiSTKT08 %@ 978-0-7695-3396-4

@inproceedings{conf/ats/HigamiSTKT08, added-at = {2023-03-24T00:00:00.000+0100}, author = {Higami, Yoshinobu and Saluja, Kewal K. and Takahashi, Hiroshi and ya Kobayashi, Shin and Takamatsu, Yuzo}, biburl = {https://www.bibsonomy.org/bibtex/21dec63f6536edd879541e2e7fda237e1/dblp}, booktitle = {ATS}, crossref = {conf/ats/2008}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2008.39}, interhash = {afba65ea4376a0bf79920ce30962c7dd}, intrahash = {1dec63f6536edd879541e2e7fda237e1}, isbn = {978-0-7695-3396-4}, keywords = {dblp}, pages = {97-102}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:37:03.000+0200}, title = {Increasing Defect Coverage by Generating Test Vectors for Stuck-Open Faults.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2008.html#HigamiSTKT08}, year = 2008 }