%0 Conference Paper %1 conf/itc/SchlangenLKBJMWLK07 %A Schlangen, Rudolf %A Leihkauf, Reiner %A Kerst, Uwe %A Boit, Christian %A Jain, Rajesh %A Malik, Tahir %A Wilsher, Keneth R. %A Lundquist, Ted R. %A Krüger, Bernd %B ITC %D 2007 %E Sibert, Jill %E Rajski, Janusz %I IEEE Computer Society %K dblp %P 1-9 %T Backside E-Beam Probing on Nano scale devices. %U http://dblp.uni-trier.de/db/conf/itc/itc2007.html#SchlangenLKBJMWLK07 %@ 1-4244-1128-9

@inproceedings{conf/itc/SchlangenLKBJMWLK07, added-at = {2023-03-23T00:00:00.000+0100}, author = {Schlangen, Rudolf and Leihkauf, Reiner and Kerst, Uwe and Boit, Christian and Jain, Rajesh and Malik, Tahir and Wilsher, Keneth R. and Lundquist, Ted R. and Krüger, Bernd}, biburl = {https://www.bibsonomy.org/bibtex/22beec63b14f9b45da8e132bcc2024cf4/dblp}, booktitle = {ITC}, crossref = {conf/itc/2007}, editor = {Sibert, Jill and Rajski, Janusz}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2007.4437627}, interhash = {b3610e197ddcb899f20dcaaeaa2c8c31}, intrahash = {2beec63b14f9b45da8e132bcc2024cf4}, isbn = {1-4244-1128-9}, keywords = {dblp}, pages = {1-9}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:27:25.000+0200}, title = {Backside E-Beam Probing on Nano scale devices.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2007.html#SchlangenLKBJMWLK07}, year = 2007 }