%0 Conference Paper %1 conf/itc/PancholyRM90 %A Pancholy, Ashish %A Rajski, Janusz %A McNaughton, Larry J. %B ITC %D 1990 %I IEEE Computer Society %K dblp %P 938-947 %T Empirical failure analysis and validation of fault models in CMOS VLSI. %U http://dblp.uni-trier.de/db/conf/itc/itc1990.html#PancholyRM90 %@ 0-8186-9064-X

@inproceedings{conf/itc/PancholyRM90, added-at = {2023-03-23T00:00:00.000+0100}, author = {Pancholy, Ashish and Rajski, Janusz and McNaughton, Larry J.}, biburl = {https://www.bibsonomy.org/bibtex/2950251a44adc39cdb73e6edb6c20a155/dblp}, booktitle = {ITC}, crossref = {conf/itc/1990}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1990.114114}, interhash = {b3a0cc98f19479e15ea021ecd0ff09b3}, intrahash = {950251a44adc39cdb73e6edb6c20a155}, isbn = {0-8186-9064-X}, keywords = {dblp}, pages = {938-947}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:52:40.000+0200}, title = {Empirical failure analysis and validation of fault models in CMOS VLSI.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1990.html#PancholyRM90}, year = 1990 }