%0 Journal Article %1 journals/mr/VandeveldeA04 %A Vandevelde, Bart %A Andersson, Dag %D 2004 %J Microelectron. Reliab. %K dblp %N 12 %P 1891-1892 %T Package and solder joint reliability analysed by FEM simulation and experiments. %U http://dblp.uni-trier.de/db/journals/mr/mr44.html#VandeveldeA04 %V 44

@article{journals/mr/VandeveldeA04, added-at = {2020-02-22T00:00:00.000+0100}, author = {Vandevelde, Bart and Andersson, Dag}, biburl = {https://www.bibsonomy.org/bibtex/293c71204d027deea7b6cc00f3499a1c1/dblp}, ee = {https://doi.org/10.1016/j.microrel.2004.04.014}, interhash = {b4a1bd6d60d5ffb1e4709118aa5358c3}, intrahash = {93c71204d027deea7b6cc00f3499a1c1}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 12, pages = {1891-1892}, timestamp = {2020-02-25T13:29:31.000+0100}, title = {Package and solder joint reliability analysed by FEM simulation and experiments.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr44.html#VandeveldeA04}, volume = 44, year = 2004 }