%0 Journal Article %1 journals/tcad/Stapper91 %A Stapper, Charles H. %D 1991 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 3 %P 399-406 %T Statistics associated with spatial fault simulation used for evaluating integrated circuit yield enhancement. %U http://dblp.uni-trier.de/db/journals/tcad/tcad10.html#Stapper91 %V 10

@article{journals/tcad/Stapper91, added-at = {2020-09-24T00:00:00.000+0200}, author = {Stapper, Charles H.}, biburl = {https://www.bibsonomy.org/bibtex/2d7f1bebbab589c34103d6ffc1713ec08/dblp}, ee = {https://doi.org/10.1109/43.67793}, interhash = {b62305ae85f3f506f3fc9d2cd2d5e9d9}, intrahash = {d7f1bebbab589c34103d6ffc1713ec08}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 3, pages = {399-406}, timestamp = {2020-09-25T11:49:09.000+0200}, title = {Statistics associated with spatial fault simulation used for evaluating integrated circuit yield enhancement.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad10.html#Stapper91}, volume = 10, year = 1991 }