%0 Conference Paper %1 conf/ats/YoshikawOIF05 %A Yoshikawa, Yuki %A Ohtake, Satoshi %A Inoue, Michiko %A Fujiwara, Hideo %B Asian Test Symposium %D 2005 %I IEEE Computer Society %K dblp %P 254-259 %T Design for Testability Based on Single-Port-Change Delay Testing for Data Paths. %U http://dblp.uni-trier.de/db/conf/ats/ats2005.html#YoshikawOIF05 %@ 0-7695-2481-8

@inproceedings{conf/ats/YoshikawOIF05, added-at = {2023-03-24T00:00:00.000+0100}, author = {Yoshikawa, Yuki and Ohtake, Satoshi and Inoue, Michiko and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/2aab46b63c1fcd6bf89dbbe60b4372a34/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2005.47}, interhash = {b6b343603e66c7626075ab5a99d294b7}, intrahash = {aab46b63c1fcd6bf89dbbe60b4372a34}, isbn = {0-7695-2481-8}, keywords = {dblp}, pages = {254-259}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:05.000+0200}, title = {Design for Testability Based on Single-Port-Change Delay Testing for Data Paths.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2005.html#YoshikawOIF05}, year = 2005 }