%0 Journal Article %1 journals/mr/JonesHDG15 %A Jones, Jason P. %A Heller, Eric %A Dorsey, Donald %A Graham, Samuel %D 2015 %J Microelectron. Reliab. %K dblp %N 12 %P 2634-2639 %T Transient stress characterization of AlGaN/GaN HEMTs due to electrical and thermal effects. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#JonesHDG15 %V 55

@article{journals/mr/JonesHDG15, added-at = {2022-10-02T00:00:00.000+0200}, author = {Jones, Jason P. and Heller, Eric and Dorsey, Donald and Graham, Samuel}, biburl = {https://www.bibsonomy.org/bibtex/2306e3545a1251a50239711547ad8ec3d/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.08.019}, interhash = {b720ad30bbb83339ed0258de2b429d2b}, intrahash = {306e3545a1251a50239711547ad8ec3d}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 12, pages = {2634-2639}, timestamp = {2024-04-09T02:49:20.000+0200}, title = {Transient stress characterization of AlGaN/GaN HEMTs due to electrical and thermal effects.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#JonesHDG15}, volume = 55, year = 2015 }