%0 Conference Paper %1 conf/iolts/DouinPLFP05 %A Douin, Alexandre %A Pouget, Vincent %A Lewis, Dean %A Fouillat, Pascal %A Perdu, Philippe %B IOLTS %D 2005 %I IEEE Computer Society %K dblp %P 9-13 %T Electrical Modeling for Laser Testing with Different Pulse Durations. %U http://dblp.uni-trier.de/db/conf/iolts/iolts2005.html#DouinPLFP05 %@ 0-7695-2406-0

@inproceedings{conf/iolts/DouinPLFP05, added-at = {2023-03-23T00:00:00.000+0100}, author = {Douin, Alexandre and Pouget, Vincent and Lewis, Dean and Fouillat, Pascal and Perdu, Philippe}, biburl = {https://www.bibsonomy.org/bibtex/2b2957256947f8a3a94eacca0811a855f/dblp}, booktitle = {IOLTS}, crossref = {conf/iolts/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.27}, interhash = {b88adb0a161fc2c711ca22ebb931cc91}, intrahash = {b2957256947f8a3a94eacca0811a855f}, isbn = {0-7695-2406-0}, keywords = {dblp}, pages = {9-13}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T10:50:59.000+0200}, title = {Electrical Modeling for Laser Testing with Different Pulse Durations.}, url = {http://dblp.uni-trier.de/db/conf/iolts/iolts2005.html#DouinPLFP05}, year = 2005 }