%0 Journal Article %1 journals/mr/TremouillesBBBPGL03 %A Trémouilles, David %A Bertrand, Géraldine %A Bafleur, Marise %A Beaudoin, Felix %A Perdu, Philippe %A Guitard, Nicolas %A Lescouzères, Lionel %D 2003 %J Microelectron. Reliab. %K dblp %N 1 %P 71-79 %T TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. %U http://dblp.uni-trier.de/db/journals/mr/mr43.html#TremouillesBBBPGL03 %V 43

@article{journals/mr/TremouillesBBBPGL03, added-at = {2021-02-15T00:00:00.000+0100}, author = {Trémouilles, David and Bertrand, Géraldine and Bafleur, Marise and Beaudoin, Felix and Perdu, Philippe and Guitard, Nicolas and Lescouzères, Lionel}, biburl = {https://www.bibsonomy.org/bibtex/2e51dad6191542fe4a302ed2a1601a55c/dblp}, ee = {https://doi.org/10.1016/S0026-2714(02)00127-0}, interhash = {bd646c3f57bf8e59b1e1704050fca5cd}, intrahash = {e51dad6191542fe4a302ed2a1601a55c}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 1, pages = {71-79}, timestamp = {2024-04-09T02:49:06.000+0200}, title = {TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#TremouillesBBBPGL03}, volume = 43, year = 2003 }